Computer vision (CV) and image processing are two closely related fields that utilize techniques from artificial intelligence (AI) and pattern recognition to derive meaningful information from images, ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Perfusion CT scanning, an emerging imaging technology, got a bad rap last year when a machine set to incorrect radiation levels overdosed hundreds of people in Los Angeles. In the wake of this ...

Acknowledging the pain points of the NOVA classification system, researchers have developed a machine learning algorithm to accurately predict the degree of processing for any food. The extent to ...