Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
How to improve the performance of CNN architectures for inference tasks. How to reduce computing, memory, and bandwidth requirements of next-generation inferencing applications. This article presents ...
Researchers in China have created a dataset of various PV faults and normalized it to accommodate different array sizes and typologies. After testing the new approach in combination with the 1D-CNN ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback