To achieve higher quality on today's multimillion-gate designs and high-speed ASICs, structured DFT (design-for-test) methodologies such as scan, at-speed test, scan compression, and BIST (built-in ...

The problem with today's existing methodologies is that verification issubservient to design. This principle requires a shift in paradigm,especially in designing complex electronic systems. Why?

This course will provide you with the requisite scientific knowledge and understanding of analytical method lifecycle, which includes the activities of validation, verification, and transfer, to allow ...