Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

ESF has received a $1.12 million grant from the National Science Foundation for a new field emission scanning/transmission electron microscope that will be the only one of its kind in Central New York ...

The demand for alleged “workhorse” transmission electron microscopes (TEMs) has been increasing in line with evolving scanning (S)/TEM technologies and techniques. Researchers and engineers from ...

What is Scanning Transmission X-ray Microscopy (STXM)? Scanning Transmission X-ray Microscopy (STXM) is a powerful imaging technique that combines the principles of X-ray spectroscopy and microscopy ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

The special Collection “Machine learning for automated experimentation in STEM” explores all aspects of the integration of machine learning (ML) into STEM to transform experimental workflows. This ...

Beam-sensitive zeolites are difficult to study at high resolution because traditional electron microscopy often damages or destroys their delicate crystal structures before meaningful data can be ...

Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope. Neat!