TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...

Semiconductors are the foundation of modern-day technology, and improving their computing power is at the core of this dynamic industry. However, the mechanical performance also matters: adhesion of ...

If you want to build semiconductors at home, it seems like the best place to start might be to find a used scanning electron microscope on eBay. At least that’s how [Peter Bosch] kicked off his ...

UC Santa Barbara researchers have achieved the first-ever "movie" of electric charges traveling across the interface of two different semiconductor materials. Using scanning ultrafast electron (SUEM) ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

The Korea Research Institute of Standards and Science (KRISS, President Lee Ho Seong) has developed an artificial intelligence (AI)-based image segmentation algorithm that can rapidly reconstruct ...

A technical paper titled “Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves).” was published by ...

Yue-Hui Li, Rui-Shi Qi, Ruo-Chen Shi, Jian-Nan Hu, Zhe-Tong Liu, Yuan-Wei Sun, Ming-Qiang Li, Ning Li, Can-Li Song, Lai Wang, Zhi-Biao Hao, Yi Luo, Qi-Kun Xue, Xu-Cun Ma, Peng Gao Proceedings of the ...