The first two installments in this series reported in detail on field reliability experience of Efficient Power Conversion (EPC) Corporation’s enhancement-mode gallium nitride (eGaN®) FETs and ...
High Temperature Reverse Bias (HTRB) testing is often used to verify the reliability of power semiconductor diodes. This application note describes the requirements of a valid HTRB test for power ...
Product burn-in (BI) is an indispensable step in the production test flow to ensure good quality and a properly functioning product for the customer. Amkor takes pride in rating ‘quality delivered to ...
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