Majority of the silicon with-in a design is occupied by memories. Memories are more prone to failures than logic due to their density. Several techniques have been established to target and detect ...

BIST (Built-in self-test) is a feature provided in integrated circuits which allow testing its own operation without need of any external hardware. It is a must have feature in safety critical SoCs.

Embedded memories are an indispensable part of any deep submicron System on a Chip (SoC). The requirement arises not only to validate the digital logic against manufacturing defects but also do robust ...