Machine learning helps track semiconductor defects under more realistic temperature conditions

All materials contain inherent defects. These are not always harmful, since they can be used to engineer and introduce ...
Science Daily

Researchers use machine learning to detect defects in additive manufacturing

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
EurekAlert!

Researchers use machine learning to detect defects in additive manufacturing

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...