This illustration depicts a non-destructive evaluation system empowered by generative artificial intelligence (AI) to simulate and analyze internal material defects. Leveraging virtual defect ...

Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...