Magnetic flux leakage (MFL) testing is a widely established non‐destructive evaluation technique used to assess the integrity of ferromagnetic materials in applications such as pipeline inspection and ...
Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
IMDEA Software researchers Facundo Molina, Juan Manuel Copia and Alessandra Gorla present FIXCHECK, a novel approach to improve patch fix analysis that combines static analysis, randomized testing and ...
At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
HAMPTON, Va., Oct. 2, 2018 /PRNewswire/ -- Ardenna, the world leader in AI-based automated defect detection capabilities, announced today the ability to automatically identify defects using software ...
As the semiconductor world excitingly explores the potential of new advanced package solutions for their intricate and novel designs, challenges arise from undetected defects caused by the complexity ...
360 Rail Services, the leading provider of engineering, construction, operations and maintenance services for the rail industry, has announced the selection of Ardenna’s Rail Defect Detection SaaS for ...
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