Pipeline defect analysis and assessment remains a critical area of research, given its direct impact on the safety and reliability of energy transportation infrastructures. Mechanical defects such as ...

According to news reports, Samsung and TSMC are expected to enter 5nm process mass production in 2020. The competition in 5nm wafer yield and market share will be very intense. A brand new wafer ...

Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...

Since the 1920s, sheet steel has been the most commonly utilized structural material in the automobile industry, with steel’s strength and stiffness making it ideally suited for durable chassis and ...

The Atomic Force Microscope (AFM) has evolved from an extremely high resolution scientific research instrument into a highly accurate metrology tool. This evolution has broadened the role of the AFM ...

A joint research team has successfully identified, for the first time, the specific types of defects responsible for efficiency loss in silicon heterojunction (SHJ) solar cells. Subscribe to our ...

Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal ...

Quality control specialists working within the manufacturing environment, or experts in research and development (R&D) working on product prototypes, need to have a complete picture of any defects ...

Code testing with modern static analysis provides a solution that not only allows developers to identify and fix concurrency defects in new code, it also provides a cost-effective and automated way to ...