The field of nanoparticle imaging and characterisation has witnessed remarkable advances through the development of techniques that offer unprecedented spatial and temporal resolution while ...
Researchers from the University of Science and Technology of China (USTC) have unveiled a planar optical device that significantly enhances the capabilities of dark-field microscopy, achieving ...
(Nanowerk News) X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult ...
Versatility and miniaturization of imaging systems is of great importance in today’s information society. Microscopic imaging techniques have always been indispensable for scientific research, ...
insights from industryFernando C. Castro, Ph.D.Applications ScientistGatan In this interview, Fernando C. Castro, Ph.D., an Applications Scientist at Gatan, talks to AZoMaterials about the new ...
Researchers from the University of Science and Technology of China (USTC) led by Prof. ZHANG Douguo have unveiled a planar optical device that significantly enhances the capabilities of dark-field ...
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