Electronic Design

Charged Device Model (CDM) ESD Testing: Getting a Clearer Picture

Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...
Semiconductor Engineering

ESD Co-Design For High-Speed SerDeS In FinFET Technologies

An electronic device is susceptible to Electrostatic Discharge (ESD) damage during its entire life cycle, including the phase from the completion of the silicon wafer processing to when the device ...
Electronic Design

ESD Hazards in IC Handlers

In the semiconductor manufacturing industry, damage and yield losses attributed to the effects of static charges are well documented along with the determination of many of the specific causes. 1 If ...
Semiconductor Engineering

Context-Aware SPICE Simulation Improves The Fidelity Of ESD Analysis

Electrostatic discharge (ESD) is a major reliability concern for integrated circuit (IC) designs. ESD verification is proving to be a significant challenge at advanced nodes, due to growing IC design ...