Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...