Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...
Photothermal AFM-IR, commonly referred to as AFM-IR, is an analytical technique used to understand the chemistry of a material at the nanoscale. It combines the nanoscale spatial resolution of atomic ...
May 16, 2014. Agilent Technologies Inc. has introduced its AFM-enabled scanning electrochemical microscopy (SECM) mode, a seamlessly integrated technology package that enables scientists to perform ...
Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results