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TOF-SIMS depth profile data | Download Scientific Diagram
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TOF-SIMS acquired depth profile of NbO + . | Down…
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(Color online) ToF-SIMS depth profile showing the depth distribution of ...
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TOF-SIMS depth profile of a sample that was etched for 180 minutes (30 ...
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(Color online) ToF-SIMS depth profile showing the …
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ToF SIMS depth profile showing elemental distrib…
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TOF-SIMS depth-profile on a α-Fe 2 O 3 film grown on Ni foil at 250 °C ...
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TOF-SIMS depth-profile on a α-Fe 2 O 3 film grown o…
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(a) The depth profile of the ToF-SIMS analysis gives …
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(a) ToF-SIMS depth profiles of 2 H − , C 3 − and SiO 2 − ions. T…
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ToF-SIMS depth profiles of the fresh (a) control and …
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ToF-SIMS depth profile for: (a) Pb²⁺ in film doping with differen…
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TOF-SIMS depth profile of samples A and B. (a) GeO⁻ (b) AlO⁻ (c) SiO ...
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TOF-SIMS depth profile of A an…
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TOF-SIMS depth profile of A and A* samples. The d…
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Characteristic fragments take…
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TOF-SIMS depth profile on a standard sample prepared by spinning: all ...
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ToF-SIMS depth profile of three 6 nm thick Phe delt…
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Normalised ToF-SIMS depth profile analysis for (a) p-tBCHA coated ...
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(Color online) ToF-SIMS dep…
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TOF–SIMS depth profile of the as implanted sample performed in negative ...
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ToF-SIMS depth profile of an YSZ/Y 2 O 3 multilayer sample wi…
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(a) TOF-SIMS depth profile measurements for Bi and Se fo…
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TOF‐SIMS depth profiles and surface mapping pictu…
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ToF-SIMS depth profile of samples S2 and S3. For both samples, the Si 2 ...
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a) ToF‐SIMS depth profiles of the various THF‐mix de…
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Normalized ToF-SIMS depth profiles over 400 s of Ti þ , …
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The TOF-SIMS depth profiles of the (a) as-dep…
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TOF-SIMS depth profiles of the device 1 (solid line) and the device 2 ...
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